Electron Microscopy Core Facility Usage and Access (updated 7 May 2020)
In order for the EM facility to function while maintaining COVID safety and physical distancing protocols, the following policies are in place until further notice.
1. All instrument training is cancelled as it requires learners and EM staff to be in close contact in the microscope rooms.
2. To avoid multiple groups gathering in the EM lab at the same time, an appointment is required to schedule bringing samples to the facility (email email@example.com). This is restricted to one person per appointment. A mask must be worn. Samples should be placed on the first bench inside the EM lab.
3. Because the microscope rooms are small and physical distancing is not possible, we must stop the practice of researchers sitting with EM staff to examine their samples or having staff set them up and overseeing their usage. Going forward, only EM staff will examine samples and provide digital images to researchers. Researchers should provide a link to a dropbox or other on-line repository so that images can be uploaded remotely. These procedures may require some back and forth to get the requisite data and increase turnaround time.
4. At least during the initial research ramp up, the current practice of experienced users examining their own samples is stopped. This is necessary as it would require the microscopes, sample loader, condenser/objective aperture controls, all the control knobs, keyboards, computer mouse etc. to be decontaminated after every usage which is not feasible. Email firstname.lastname@example.org and/or email@example.com to discuss mechanisms to get the required data.
For questions email firstname.lastname@example.org
The Central Electron Microscope Facility (CEMF) is a UConn Health-supported research facility providing electron microscopy research service for faculty, students and extramural users. The CEMF occupies approximately 1,800 sq. ft. of space on B level of the main UConn Health building (rooms AB027 and AB031). The CEMF has three recently installed electron microscopes (EMs) equipped with digital imaging capabilities: a Hitachi H-7650 transmission EM, a JEOL JSM-5900LV scanning EM and a Zeiss Sigma Gemini HV field emission Scanning EM. Sample preparation instruments include ultramicrotomes, vacuum evaporator, sputter coater, critical point dryer, high pressure freezer, freeze substitution system and ion beam coater. The electron microscopes and other instruments also are available for use by experienced faculty or students. Training is available on an individual basis or in a formal graduate course offered every other year.
Electron Microscopy Facility Policies Concerning Training and EM Use
- Training of individual students/research staff in the use of the TEM and SEM is performed on an individual basis only. If multiple researchers from a single lab wish to be trained, each trainee must be scheduled separately.
- Following initial training in TEM/SEM use, students/research staff may sign up for and use the microscopes. However, this usage must be overseen by Maya Yankova and so can only occur during normal business hours when Maya Yankova is present in the EM laboratory. Exceptions to this policy are made only in rare cases on an individual basis for highly experienced personnel.